Quantitative dynamic force microscopy with inclined tip oscillation

• Philipp Rahe,
• Daniel Heile,
• Reinhard Olbrich and
• Michael Reichling

Beilstein J. Nanotechnol. 2022, 13, 610–619, doi:10.3762/bjnano.13.53

• path perpendicular to the surface, provide quantitative information about the details of the tip–surface interaction when properly analysed [2]. Recently, a universal description of quantitative dynamic force microscopy based on the harmonic approximation has been developed [3], yielding three central

• dynamic force microscopy by arbitrary tip sampling and data recording paths. For a typical inclination of α = 12.5°, the minimum force was calculated to differ by more than 5% when compared to a result not taking the inclination into account. The magnitude of this difference depends on the model parameter

Coupled molecular and cantilever dynamics model for frequency-modulated atomic force microscopy

• Michael Klocke and
• Dietrich E. Wolf

Beilstein J. Nanotechnol. 2016, 7, 708–720, doi:10.3762/bjnano.7.63

• [24][27][28]. Lennard-Jones crystals If one uses the Lennard-Jones potential, for simulating dynamic force microscopy, the tip in Figure 1 in general does not remain intact, but may loose its apex atom, if it comes too close to the substrate. This can be shown simply by comparing the adsorption energy

Nano-contact microscopy of supracrystals

• Adam Sweetman,
• Nicolas Goubet,
• Ioannis Lekkas,
• Marie Paule Pileni and
• Philip Moriarty

Beilstein J. Nanotechnol. 2015, 6, 1229–1236, doi:10.3762/bjnano.6.126

• scanning tunnelling microscopy and dynamic force microscopy. Results: By exploring the evolution of both the force and tunnel current with respect to tip–sample separation, we arrive at the surprising finding that single nanocrystal resolution is readily obtained in tunnelling microscopy images acquired

• tunnelling microscopy and spectroscopy. Keywords: dynamic force microscopy; nanoparticle; non-contact atomic force microscopy; point contact imaging; scanning probe microscopy; supracrystal; Introduction Artificial solids comprising extended assemblies of nanocrystals with a narrow size distribution

• based on a combination of STM and dynamic force microscopy (DFM) imaging and spectroscopy. DFM experiments, also known as non-contact AFM (NC-AFM), are carried out using a quartz tuning fork sensor in the qPlus geometry [16][17] to which a tip has been glued. Shifts in the resonant frequency of a tine

Dynamic force microscopy simulator (dForce): A tool for planning and understanding tapping and bimodal AFM experiments

• Horacio V. Guzman,
• Pablo D. Garcia and
• Ricardo Garcia

Beilstein J. Nanotechnol. 2015, 6, 369–379, doi:10.3762/bjnano.6.36

• Horacio V. Guzman Pablo D. Garcia Ricardo Garcia Instituto de Ciencia de Materiales de Madrid, CSIC, Sor Juan Inés de la Cruz 3, 28049 Madrid, Spain 10.3762/bjnano.6.36 Abstract We present a simulation environment, dForce, which can be used for a better understanding of dynamic force microscopy

Spring constant of a tuning-fork sensor for dynamic force microscopy

• Dennis van Vörden,
• Manfred Lange,
• Merlin Schmuck,
• Nico Schmidt and
• Rolf Möller

Beilstein J. Nanotechnol. 2012, 3, 809–816, doi:10.3762/bjnano.3.90

Repulsive bimodal atomic force microscopy on polymers

• Alexander M. Gigler,
• Christian Dietz,
• Maximilian Baumann,
• Nicolás F. Martinez,
• Ricardo García and
• Robert W. Stark

Beilstein J. Nanotechnol. 2012, 3, 456–463, doi:10.3762/bjnano.3.52

• regime of dynamic force microscopy. We thus investigated bimodal imaging on a polystyrene-block-polybutadiene diblock copolymer surface and on polystyrene. The attractive operation regime was only stable when the amplitude of the second eigenmode was kept small compared to the amplitude of the

Surface functionalization of aluminosilicate nanotubes with organic molecules

• Wei Ma,
• Weng On Yah,
• Hideyuki Otsuka and
• Atsushi Takahara

Beilstein J. Nanotechnol. 2012, 3, 82–100, doi:10.3762/bjnano.3.10

• (SFM) in a dynamic force microscopy (DFM) mode employing a sharp diamondlike carbon (DLC) tip with a radius of curvature of 1 nm. Figure 13a shows a height image of one sample with Mn = 32700 and Mn/Mw = 1.33. Discrete nanostructures were randomly distributed on the mica surface and no aggregation was

• to P3HT and was ascribed to a larger amount of the P3HT/HT3P-imogolite aggregate. Upon hybridization, HT3P-imogolite greatly restricts the rotational motion of the P3HT backbone, such that it produces a much longer conjugation length than pure P3HT. Dynamic force microscopy (DFM) has proved to be a

Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy

• Thomas König,
• Georg H. Simon,
• Lars Heinke,
• Leonid Lichtenstein and
• Markus Heyde

Beilstein J. Nanotechnol. 2011, 2, 1–14, doi:10.3762/bjnano.2.1

• applied on thin oxide films beyond imaging the topography of the surface atoms. Keywords: aluminum oxide; charge state; contact potential; defects; domain boundaries; dynamic force microscopy; frequency modulation atomic force microscopy; Kelvin probe force microscopy; magnesium oxide; non-contact atomic

• atomic force microscopy (FM-AFM) or dynamic force microscopy (DFM). For the stability of tip and sample as well as for the reduction of piezo creep, piezo hysteresis, thermal drift and noise level, the setup was operated in ultrahigh vacuum (UHV) at low temperature (5 K). The resulting high stability